Micram

Test&Measurement is a  Micram business unit, providing services to bring better products to market faster, by supporting the product development cycle. Primary focus is on the time consuming period from first silicon to production release. Here, the powerful combination of Test&Measurement with Rapid!Prototyping and design services, yields short optimization cycles with board, chip and measurement engineers working hand in hand at Micram.

Test&Measurement utilizes state-of-the-art time and frequency domain measurement equipment for data rates and frequencies up to 50 Gb/s and 65 GHz. The services, performed by experienced design and measurement engineers, on wafer level in a cleanroom class 10,000 are e.g. well suited for

• device characterization, evaluation
• parameter extraction
• model generation
• at-speed on wafer measurements
• failure analysis
• on-chip/on-wafer probing and manipulating

in a wide range of applications e.g. in the ATE, Measurement, and Communications sectors.

 A short overview on measurement equipment and capabilities can be found in the following sections. Micram's Test&Measurement services are offered in conjunction with any Micram turnkey ASIC development as well as a separate complementary customer service. In addition to this in-house service, Micram carries out wafer and package level tests at any volume as well as reliability and qualification tests through dedicated industrial partner services. For more information on Test&Measurement services, please contact your Micram sales representative.